Design For Test is a term related to Semiconductors Field.
This is used in ASIC (Application Specific Integrated Circuit) designs.
Design For Test is a technique of adding logic in the ASIC to help the testing of manufacturing defects.
There are many techniques of DFT and different types of faults targeted.
I will try to focus on different DFT techniques used and different types of faults targeted in this blog.
Please feel free to correct where ever necessary.
